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© Toshie Yaguchi, Yasushi Kuroda, Takeo Kamino (Hitachi Science Systems, Ltd.)
© Takahito Hashimoto (Instrument Division, Hitachi, Ltd.)
© Masato Nakatsuka (Head office, Tohoku University), Kazuyuki Tohji(Tohoku University)
The front picture shows SEM image of a stratified particle of Fe with TiO2 and SiO2 layers. The picture behind the SEM image shows STEM image of the particle after preparing transparent specimen by FIB technique. The cross sectional view demonstrate fine structures for the Fe particle and the layers of SiO2(20 nm), TiO2(40nm),SiO2(40 nm) and TiO2(20 nm).
At 56th photo contest hosted by the Japanese Society of Electron Microscopy in 2000.