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© Mitsuru Konno, Toshie Yaguchi, Takeo Kamino, Takahito Hashimoto, Tsuyoshi Oonishi(Hitachi High-Technologies corporation)
Here is the electron beam diffraction image observed with 180 degrees rounded. 13 electronic diffraction images centered in are continually observed without lack. The center is an SEM image of the sample used for the observation. The sample was observed with sample rotation holder after processing to the diameter 0.2 µm column by FIB micro sampling method. Three-dimensional nanostructure analysis by an electron microscope can be said progressed.
1st Prize. At 61st photo contest hosted by the Japanese Society of Microscopy in 2005.