The light of gas lamps on the arch bridge
© Yuka Nishimoto (Hitachi High-Tech Fielding corporation)
The micrograph shows a scanning ion microscope (SIM) image of the micron-sized arch bridge, prepared by a focused ion beam (FIB) technique. The specimen is extracted from a Si wafer by using a micro-sampling method and mounted on a needle stub of a specimen rotation holder. The 15 µm high gas lamps were also fabricated using FIB by rotating the specimen.
1st Prize. At 63rd photo contest hosted by the Japanese Society of Microscopy in 2007.
Condition
Specimen: Single crystal Silicon
Instrument: Focused lon Beam System FB-2100
Magnification : × 3,500
Accelerating voltage: 40 kV
*All information related to these photographers is based on the information when the photo was taken.
*This work was presented at the "photo contest" hosted by the Japanese Society
of Microscopy.
*Reproduction or republication without permission prohibited.
*"nanoart" is registered trademark of Hitachi High-Tech Corporation in Japan.
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