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© Yuya Suzuki, Mitsuru Konno, Junzo Azuma (Hitachi High-Tech corporation)
© Yuka Nishimoto (Hitachi High-Tech Fielding corporation)
The micrograph shows a scanning ion microscope (SIM) image of the micron-sized arch bridge, prepared by a focused ion beam (FIB) technique. The specimen is extracted from a Si wafer by using a micro-sampling method and mounted on a needle stub of a specimen rotation holder. The 15 µm high gas lamps were also fabricated using FIB by rotating the specimen.
1st Prize. At 63rd photo contest hosted by the Japanese Society of Microscopy in 2007.