© Yuya Suzuki, Mitsuru Konno, Tsuyoshi Ohnishi, Toshihide Agemura, Isamu Sekihara, Junzo Azuma (Hitachi High-Tech corporation)
The micrograph is a Scanning Electron Microscope(SEM) image of a micron sized temple prepared with a Focused Ion Beam(FIB) system.
In the FIB system, a micron-sized Silicon wafer was picked up with the micro-sampling method and mounted on a needle stub of a specimen rotation holder. The posts were also fabricated using FIB by rotating the specimen.
At 64th photo contest hosted by the Japanese Society of Microscopy in 2008.
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