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Golden Temple

The micrograph is a Scanning Electron Microscope(SEM) image of a micron sized temple prepared with a Focused Ion Beam(FIB) system.
In the FIB system, a micron-sized Silicon wafer was picked up with the micro-sampling method and mounted on a needle stub of a specimen rotation holder. The posts were also fabricated using FIB by rotating the specimen.

At 64th photo contest hosted by the Japanese Society of Microscopy in 2008.

Condition

Specimen: Single crystal Silicon
Instrument: Focused Ion & Electron Beam System nanoDUE'T NB5000
Magnification : ×2,000
Accelerating voltage: 5 kV

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All information related to these photographers is based on the information when the photo was taken.

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This work was presented at the "photo contest" hosted by the Japanese Society of Microscopy.

The Japanese Society of Microscopy

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Reproduction or republication without permission prohibited.

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"nanoart" is registered trademark of Hitachi High-Technologies Corporation in Japan.

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