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June 22, 2011
On June 15, 2011, Tokyo District Court issued a preliminary injunction ordering FEI Japan not to make, sell, assign, lease, offer for assignment or lease, display for the purpose of assignment or lease, or import the products below. The order was to grant Hitachi High-Technologies' motion, which was filed December 15, 2010, in Tokyo District Court. In the motion, Hitachi High-Technologies alleged FEI's FIB/SEM apparatus* infringed Japanese patent No. 2,774,884 ("884 patent") related to Micro-Sampling technology using Focused Ion Beam, and sought a preliminary injunction against FEI Japan.
Equipped with a probe (Omniprobe or Autoprobe) and GIS apparatus* with Platinum Deposition gas, Tungsten Deposition gas, or Carbon Deposition gas.
In addition, regarding 884 patent, Tokyo Customs has already officially accepted Hitachi High-Technologies' motion to suspend importation for the products below.
Equipped with Omniprobe and GIS apparatus.
Hitachi High-Technologies considers our intellectual property rights as important management resource, and will make every effort to protect such rights.
Corporate Communications Dept., CSR Div.
Aiko Matsumoto / Reiko Takeuchi