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March 12, 2012
On March 6, Tokyo Customs officially accepted a petition filed by Hitachi High-Technologies Corporation (TOKYO: 8036, Hitachi High-Tech) to prohibit FEI Japan from importing FIB/SEM Equipment* produced by U.S.-based FEI Company into Japan, based on claims that the FEI/SEM Equipment* produced by FEI Company (listed below) infringes Japanese Patent No. 4589993 ("'993 Patent") which relates to micro-sampling technology used in focused ion beam systems. The foregoing acceptance by Tokyo Customs was made following the Japanese Patent Office's dismissal of the request for trial for invalidation of the '993 patent filed by FEI company:
Hitachi High-Technologies considers our intellectual property rights as important management resource, and will make every effort to protect such rights.
Corporate Communications Dept.,
Aiko Matsumoto / Reiko Takeuchi