Skip to main content
September 3, 2013
Hitachi High-Tech Science Corporation announces the development and worldwide release of the EA1000VX on September 10th, 2013. The improved X-ray analyzer enables fast and simple screening of hazardous substances (regulated by European Union directives such as ELV, WEEE, and RoHS) in automobiles and electrical/electronic devices.
Shorter inspection time and better operability have been demanded for X-ray analyzers due to EU directives such as ELV, WEEE, and RoHS which require large number of samples to be inspected. Leading industrial countries such as Japan, the US, China, and South Korea are committed to compliance with the RoHS directive (2002/95/EC) taken effect in July 2006. The revised RoHS directive (2011/65/EU) came into force in July 2011, and applied to medical devices and electronic and electrical tools in July 2014. This revision will even accelerate the need for improved X-ray analyzers.
To supply the demand, measurement time of the EA1000VX is reduced to one-tenth of its former model, resulting in significantly increased throughput (inspection throughput per hour). Improved automatic sample material determination function automatically selects measurement conditions depending on the sample matrix. Consequently it will help users avoid making errors. In addition, this analyzer reduces workload by improved measurement spot positioning system for small or uneven surface samples, and newly designed doors. Furthermore, enhanced analytical tools and centralized data management function increase operational efficiency. These features improve overall efficiency of screening and reduce costs considerably.
The EA1000VX will be exhibited at Japan Analytical and Scientific Instruments Show 2013 (JASIS 2013) held at Makuhari Messe from September 4th to 6th.
Measurement time using the EA1000VX is one tenth compared to the conventional model SEA1000AII. (mean time when measuring plastics and brasses)
The instrument automatically determines sample materials and measures the sample.
Data measured using one or more than one instrument can be controlled by single software. This software enables users to compare and manage a trend of sample data, and provides a table of results.
The newly developed system can control Chlorine (Cl), antimony (Sb) and tin (Sn).
|Measurement Principle||Energy-dispersive X-ray fluorescence|
|Measurement Elements||Atomic Number Al (Z=13) - U(Z=92)|
|Detector||Vortex Si semiconductor detector (LN2 not required)|
(Measurement Time of Cd, Pb, Hg, Br, and Cr in Plastics)*
|Chamber Size||W370 x D320 x H120 mm|
|Dimensions||W520 x D600 x H445 mm|
Hitachi High-Tech Science is a subsidiary wholly owned by Hitachi High-Technologies Corporation (TOKYO: 8036). The company develops, manufactures and sells measurement and analysis instruments.
Sales & Marketing Department
Hitachi High-Tech Science Corporation
Reiko Takeuchi, Aiko Matsumoto,
CSR & Corporate Communications Dept.,
Hitachi High-Technologies Corporation