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FOR IMMEDIATE RELEASE
TOKYO, August 28, 2014 -- Hitachi High-Tech Science Corporation (Hitachi High-Tech Science, President: Toshiyuki Ikeda) announced the release of the AFM5000II, a Scanning Probe Microscope (SPM) controller, and the PS3500DDII, a sequential high resolution ICP Optical Emission Spectrophotometers. These instruments will be displayed at the "JASIS 2014," to be held at Makuhari Messe International Exhibition Hall from September 3rd through 5th.
Easy nano-imaging via an advanced auto measurement parameter tuning function and a new GUI
The Scanning Probe Microscope (SPM) is widely used in various fields. It detects various physical quantities such as hardness, viscoelasticity, friction, electric current, magnetism of the sample, and atomic force between the probe and the sample. It also measures topography at the nano level of the sample surface and performs physical property mapping. The new AFM5000II SPM controller is standard equipped with RealTuneII, an auto measurement parameter tuning function, and a new Graphical User Interface (GUI). This allows even inexperienced users to obtain data with high repeatability, even with samples that have not been measured before.
|Standard function||RealTuneII (Auto measurement parameter tuning function), tip calibration function, navigation, and one-click auto measurement|
|Measurement unit||AFM5100N, AFM5300E|
|Dimension, Weight||W220 x D500 x H385 mm, Approximately 15 kg|
World-class Resolution, Accuracy, and Repeatability
ICP optical emission spectrometry measures the light emitted from excited elements. There are two types of spectrophotometers, the sequential type and the simultaneous type. Sequential type spectrophotometers generally have two to three times better resolution than simultaneous type spectrophotometers. (ICP: Inductively Coupled Plasma) Through precision processing of spectroscopic optical grating, optimized optics, and direct drive scanning technology, wavelength resolution (FWHM) is improved from 0.0045 nm on conventional instruments to a world-class level of 0.003 nm (at a scanning resolution of 0.00065 nm). Improved repeatability allows for higher reliability of the measurement results.
|Model||PS3520DDII (Standard), PS3520VDDII (Vacuum), PS3520UVDDII (Vacuum Ultraviolet)|
|Wavelength Resolution (FWHM)||0.003 nm (Hg313 nm)|
|Scanning resolution||0.00065 nm|
|Wavelength driving method||Direct drive|
|Dimension, Weight||W1,325 x D815 x H1,455 mm, Approximately 310 kg|
Sales & Marketing Department
Hitachi High-Tech Science Corporation
Reiko Takeuchi, Aiko Matsumoto
Corporate Communications Dept., CSR Div.,
Hitachi High-Technologies Corporation